ar ion sputtering Search Results


ar ion sputtering  (MATHESON)
90
MATHESON ar ion sputtering
Ar Ion Sputtering, supplied by MATHESON, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar ion sputtering/product/MATHESON
Average 90 stars, based on 1 article reviews
ar ion sputtering - by Bioz Stars, 2026-02
90/100 stars
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ar ion-beam sputtering tools  (ULVAC)
90
ULVAC ar ion-beam sputtering tools
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar Ion Beam Sputtering Tools, supplied by ULVAC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar ion-beam sputtering tools/product/ULVAC
Average 90 stars, based on 1 article reviews
ar ion-beam sputtering tools - by Bioz Stars, 2026-02
90/100 stars
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plasma ion sputtering guns aja 320-2a  (AJA International)
90
AJA International plasma ion sputtering guns aja 320-2a
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Plasma Ion Sputtering Guns Aja 320 2a, supplied by AJA International, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/plasma ion sputtering guns aja 320-2a/product/AJA International
Average 90 stars, based on 1 article reviews
plasma ion sputtering guns aja 320-2a - by Bioz Stars, 2026-02
90/100 stars
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two 1-inch diameter, 3 mm thick, ion beam sputtered ar-coated (r<0.02%) fused-silica windows  (Tower Optical Corporation)
90
Tower Optical Corporation two 1-inch diameter, 3 mm thick, ion beam sputtered ar-coated (r<0.02%) fused-silica windows
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Two 1 Inch Diameter, 3 Mm Thick, Ion Beam Sputtered Ar Coated (R<0.02%) Fused Silica Windows, supplied by Tower Optical Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/two 1-inch diameter, 3 mm thick, ion beam sputtered ar-coated (r<0.02%) fused-silica windows/product/Tower Optical Corporation
Average 90 stars, based on 1 article reviews
two 1-inch diameter, 3 mm thick, ion beam sputtered ar-coated (r<0.02%) fused-silica windows - by Bioz Stars, 2026-02
90/100 stars
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ar+ ion sputtering  (Molecular Dynamics Inc)
90
Molecular Dynamics Inc ar+ ion sputtering
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar+ Ion Sputtering, supplied by Molecular Dynamics Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar+ ion sputtering/product/Molecular Dynamics Inc
Average 90 stars, based on 1 article reviews
ar+ ion sputtering - by Bioz Stars, 2026-02
90/100 stars
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ar-ion sputtering  (Anelva Corporation)
90
Anelva Corporation ar-ion sputtering
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar Ion Sputtering, supplied by Anelva Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar-ion sputtering/product/Anelva Corporation
Average 90 stars, based on 1 article reviews
ar-ion sputtering - by Bioz Stars, 2026-02
90/100 stars
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ar-ion sputtering anelva spf-2108  (Anelva Corporation)
90
Anelva Corporation ar-ion sputtering anelva spf-2108
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar Ion Sputtering Anelva Spf 2108, supplied by Anelva Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar-ion sputtering anelva spf-2108/product/Anelva Corporation
Average 90 stars, based on 1 article reviews
ar-ion sputtering anelva spf-2108 - by Bioz Stars, 2026-02
90/100 stars
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ar ion sputtering gun  (Airgas Inc)
90
Airgas Inc ar ion sputtering gun
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar Ion Sputtering Gun, supplied by Airgas Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar ion sputtering gun/product/Airgas Inc
Average 90 stars, based on 1 article reviews
ar ion sputtering gun - by Bioz Stars, 2026-02
90/100 stars
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ar–ion–gun sputtering facility  (Unilab Laboratory Furniture)
90
Unilab Laboratory Furniture ar–ion–gun sputtering facility
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar–Ion–Gun Sputtering Facility, supplied by Unilab Laboratory Furniture, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar–ion–gun sputtering facility/product/Unilab Laboratory Furniture
Average 90 stars, based on 1 article reviews
ar–ion–gun sputtering facility - by Bioz Stars, 2026-02
90/100 stars
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ar+ ion-bombardment sputtering  (Scienta Omicron GmbH)
90
Scienta Omicron GmbH ar+ ion-bombardment sputtering
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar+ Ion Bombardment Sputtering, supplied by Scienta Omicron GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar+ ion-bombardment sputtering/product/Scienta Omicron GmbH
Average 90 stars, based on 1 article reviews
ar+ ion-bombardment sputtering - by Bioz Stars, 2026-02
90/100 stars
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ar ion sputtering  (ULVAC)
90
ULVAC ar ion sputtering
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar Ion Sputtering, supplied by ULVAC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar ion sputtering/product/ULVAC
Average 90 stars, based on 1 article reviews
ar ion sputtering - by Bioz Stars, 2026-02
90/100 stars
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ar cluster ion (ar1000 + ) sputtering beam source  (Ion-tof GmbH)
90
Ion-tof GmbH ar cluster ion (ar1000 + ) sputtering beam source
Atomic concentrations at different <t>sputtering</t> times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Ar Cluster Ion (Ar1000 + ) Sputtering Beam Source, supplied by Ion-tof GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ar cluster ion (ar1000 + ) sputtering beam source/product/Ion-tof GmbH
Average 90 stars, based on 1 article reviews
ar cluster ion (ar1000 + ) sputtering beam source - by Bioz Stars, 2026-02
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Image Search Results


Atomic concentrations at different sputtering times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.

Journal: Heliyon

Article Title: Highly reflective silver mirror enhanced by several dielectric films prepared under the low substrate temperature

doi: 10.1016/j.heliyon.2024.e35507

Figure Lengend Snippet: Atomic concentrations at different sputtering times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.

Article Snippet: For XPS depth profiling, the Versa Probe III was equipped with Ar ion-beam sputtering tools (ULVAC-PHI, Kanagawa, Japan).

Techniques:

Atomic concentrations at different sputtering times in XPS depth profiling of sample 4.

Journal: Heliyon

Article Title: Highly reflective silver mirror enhanced by several dielectric films prepared under the low substrate temperature

doi: 10.1016/j.heliyon.2024.e35507

Figure Lengend Snippet: Atomic concentrations at different sputtering times in XPS depth profiling of sample 4.

Article Snippet: For XPS depth profiling, the Versa Probe III was equipped with Ar ion-beam sputtering tools (ULVAC-PHI, Kanagawa, Japan).

Techniques: